Ketchen, Mark B : rechercher sur Z-Library

Ketchen, Mark B., Clarke, John

Année:

2012

Langue:

english

Fichier:

PDF, 864 KB

english, 2012

Temperature fluctuations in freely suspended tin films at the superconducting transition

Journal:

Physical Review B

Année:

1978

Langue:

english

Fichier:

PDF, 691 KB

english, 1978

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Front-end-of-line quadrature-clocked voltage-dependent capacitance measurement

Polonsky, Stas, Solomon, Paul, Liao, Jiun-hsin, Medina, Lou, Ketchen, Mark

Année:

2011

Langue:

english

Fichier:

PDF, 227 KB

english, 2011

Quantum information storage using tunable flux qubits

Steffen, Matthias, Brito, Frederico, DiVincenzo, David, Farinelli, Matthew, Keefe, George, Ketchen, Mark, Kumar, Shwetank, Milliken, Frank, Rothwell, Mary Beth, Rozen, Jim, Koch, Roger H

Journal:

Journal of Physics Condensed Matter

Année:

2010

Langue:

english

Fichier:

PDF, 700 KB

english, 2010

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Generation, elimination and utilization of harmonics in ring oscillators

IEEE Circuits and Devices Magazine

Année:

2010

Langue:

english

Fichier:

PDF, 223 KB

english, 2010

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Operational amplifier based test structure for transistor threshold voltage variation

Ji, Brian L., Pearson, Dale J., Lauer, Isaac, Stellari, Franco, Frank, David J., Chang, Leland, Ketchen, Mark B.

Année:

2008

Fichier:

PDF, 620 KB

2008

Point defect yield model for wafer scale integration

Ketchen, Mark B.

Journal:

Année:

1985

Langue:

english

Fichier:

PDF, 24.00 MB

english, 1985

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - CMOS latch metastability characterization at the 65-nm-technology node

Bhushan, Manjul, Ketchen, Mark B., Das, Koushik K.

Année:

2008

Langue:

english

Fichier:

PDF, 259 KB

english, 2008

[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - Combined C-V/I-V front-end-of-line measurement

Polonsky, Stas, Realov, Simeon, Liao, Jiun-Hsin, Hargrove, Michael, Ketchen, Mark

Année:

2012

Langue:

english

Fichier:

PDF, 568 KB

english, 2012

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment

Gattiker, Anne, Bhushan, Manjul, Ketchen, Mark

Année:

2006

Langue:

english

Fichier:

PDF, 13.30 MB

english, 2006

[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - Performance characterization of PD-SOI ring oscillators at cryogenic temperatures

Vernik, Igor V., Ohki, Thomas A., Ketchen, Mark B., Bhushan, Manjul

Année:

2010

Langue:

english

Fichier:

PDF, 280 KB

english, 2010

Protecting superconducting qubits from radiation

Córcoles, Antonio D., Chow, Jerry M., Gambetta, Jay M., Rigetti, Chad, Rozen, J. R., Keefe, George A., Beth Rothwell, Mary, Ketchen, Mark B., Steffen, M.

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 1.74 MB

english, 2011

Characterization of Addressability by Simultaneous Randomized Benchmarking

Gambetta, Jay M., Córcoles, A. D., Merkel, S. T., Johnson, B. R., Smolin, John A., Chow, Jerry M., Ryan, Colm A., Rigetti, Chad, Poletto, S., Ohki, Thomas A., Ketchen, Mark B., Steffen, M.

Journal:

Année:

2012

Langue:

english

Fichier:

PDF, 262 KB

english, 2012

Efficient Measurement of Quantum Gate Error by Interleaved Randomized Benchmarking

Magesan, Easwar, Gambetta, Jay M., Johnson, B. R., Ryan, Colm A., Chow, Jerry M., Merkel, Seth T., da Silva, Marcus P., Keefe, George A., Rothwell, Mary B., Ohki, Thomas A., Ketchen, Mark B., Steffen,

Journal:

Ketchen, Mark B., Voss, Richard F.

Année:

2012

Langue:

english

Fichier:

PDF, 237 KB

english, 2012

An ultra-low-noise tunnel junction dc SQUID

Journal:

Jeffery, Mark, Van Duzer, T., Kirtley, J. R., Ketchen, M. B.

Année:

1979

Langue:

english

Fichier:

PDF, 566 KB

english, 1979

Magnetic imaging of moat-guarded superconducting electronic circuits

Journal:

Année:

1995

Langue:

english

Fichier:

PDF, 558 KB

english, 1995

CMOS Test and Evaluation ||

Steffen, Matthias, Kumar, Shwetank, DiVincenzo, David P., Rozen, J. R., Keefe, George A., Rothwell, Mary Beth, Ketchen, Mark B.

Année:

2015

Langue:

english

Fichier:

PDF, 19.62 MB

english, 2015

High-Coherence Hybrid Superconducting Qubit

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 1020 KB

english, 2010

Simple All-Microwave Entangling Gate for Fixed-Frequency Superconducting Qubits

Chow, Jerry M., Córcoles, A. D., Gambetta, Jay M., Rigetti, Chad, Johnson, B. R., Smolin, John A., Rozen, J. R., Keefe, George A., Rothwell, Mary B., Ketchen, Mark B., Steffen, M.

Journal:

Gardner, Brian W., Wynn, Janice C., Björnsson, Per G., Straver, Eric W. J., Moler, Kathryn A., Kirtley, John R., Ketchen, Mark B.

Année:

2011

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2011

Scanning superconducting quantum interference device susceptometry

Journal:

Review of Scientific Instruments

Année:

2001

Langue:

english

Fichier:

PDF, 516 KB

english, 2001

Readout for phase qubits without Josephson junctions

Steffen, Matthias, Kumar, Shwetank, DiVincenzo, David, Keefe, George, Ketchen, Mark, Rothwell, Mary Beth, Rozen, Jim

Journal:

Ketchen, Mark B., Goubau, Wolfgang M., Clarke, John, Donaldson, Gordon B.

Année:

2010

Langue:

english

Fichier:

PDF, 480 KB

english, 2010

Superconducting thin-film gradiometer

Journal:

Journal of Applied Physics

Année:

1978

Langue:

english

Fichier:

PDF, 731 KB

english, 1978

Thin-film dc SQUID with low noise and drift

Clarke, John, Goubau, Wolfgang M., Ketchen, Mark B.

Journal:

Ji, Brian, Hanafi, Hussein, Ketchen, Mark

Année:

1975

Langue:

english

Fichier:

PDF, 349 KB

english, 1975

[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - On the Connection of SRAM Cell Stability with Switching History in Partially Depleted SOI Technology

Année:

2006

Langue:

english

Fichier:

PDF, 198 KB

english, 2006

[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - Ring Oscillator Based Test Structure for NBTI Analysis

Ketchen, Mark B., Bhushan, Manjul, Bolam, Ronald

Année:

2007

Langue:

english

Fichier:

PDF, 6.43 MB

english, 2007

CMOS Test and Evaluation || CMOS Circuits Basics

Année:

2015

Langue:

english

Fichier:

PDF, 3.85 MB

english, 2015

CMOS Test and Evaluation || Basic Statistics and Data Visualization

Année:

2015

Langue:

english

Fichier:

PDF, 2.45 MB

english, 2015

Microelectronic Test Structures for CMOS Technology ||

Bulzacchelli, John F, Lee, Hae-Seung, Hong, Merit Y, Misewich, James A, Ketchen, Mark B

Année:

2011

Langue:

english

Fichier:

PDF, 10.25 MB

english, 2011

Segmented correlation measurements on superconducting bandpass delta–sigma modulator with and without input tone

Journal:

Superconductor Science and Technology

Année:

2003

Langue:

english

Fichier:

PDF, 181 KB

english, 2003

The response of small SQUID pickup loops to magnetic fields

Kirtley, John R, Paulius, Lisa, Rosenberg, Aaron J, Palmstrom, Johanna C, Schiessl, Daniel, Jermain, Colin L, Gibbons, Jonathan, Holland, Connor M, Fung, Y-K-K, Huber, Martin E, Ketchen, Mark B, Ralph

Journal:

Superconductor Science and Technology

Année:

2016

Langue:

english

Fichier:

PDF, 2.82 MB

english, 2016

Determining the vibrations between sensor and sample in SQUID microscopy

Schiessl, Daniel, Kirtley, John R., Paulius, Lisa, Rosenberg, Aaron J., Palmstrom, Johanna C., Ullah, Rahim R., Holland, Connor M., Fung, Y.-K.-K., Ketchen, Mark B., Gibson, Gerald W., Moler, Kathryn

Journal: